Tao: Microarchitecture Simulation with Machine Learning

 

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Simulation accuracy comparison with the state-of-the-art.


Invention Summary:

Microarchitecture designers rely on simulators to validate, optimize, and manufacture hardware that meets specific design requirements. Out of the current simulators, executive-driven simulators are often slow and require a high level of expertise, trace-driven simulators have low accuracy, and deep-learning-based stimulators fail to meet performance metrics such as causing branch mispredictions or cache misses.

Rutgers researchers have redesigned and optimized a deep-learning microarchitecture simulator, called Tao. By using a new training dataset design, researchers can rapidly generate and reuse these inputs across microarchitectures. Additionally, self-attention improved the detail of the simulator, and microarchitecture-agnostic embedding layers improved the speed of learning such that it significantly reduces the re-training overhead that would otherwise slow deep-learning based simulators. Tao has been shown to significantly reduce both the training and simulation time by 26.58x per microarchitecture design and maintain similar simulation accuracy as state-of-the-art DL-based endeavors.

Market Applications:

  • Architecture design space exploration
  • Microarchitecture bottleneck analysis
  • Workload characterization

Advantages:

  • Reduced training and simulation time
  • Reusable functional trace inputs
  • Predicts multiple performance metrics of interest
 

Intellectual Property & Development Status: Patent pending, provisional application filed. Available for licensing and/or research collaboration. For any business development and other collaborative partnerships contact:  marketingbd@research.rutgers.edu

Patent Information:
Licensing Manager:
Wenjuan Zhu
Licensing Manager
Rutgers, The State University of New Jersey
848-932-4058
wz284@research.rutgers.edu
Business Development:
Eusebio Pires
Senior Manager, Technology Marketing & Business Development
Rutgers, The State University of New Jersey
ep620@research.rutgers.edu
Keywords: