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New Indentation Method Using Scanning Probe Microscope
Invention Summary:
Accurate indentation measurement is fundamental to atomic force microscope (AFM)-based material property characterization as the force applied and the indentation generated are the two most important physical variables that must be measured in the characterization process. Large measurement errors occur when the measurement frequency...
Published: 10/18/2024
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Inventor(s): Qingze Zou, Juan Ren
Keywords(s): Imaging
Category(s): Technology Classifications > Physical Sciences & Engineering, Technology Classifications > Sensors, Technology Classifications > Software & Copyright, Technology Classifications > Software & Algorithms, Technology Classifications > Research Tools
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