Compact, Transferable and Modular Scanning Probe Microscope Head
Scanning probe microscope head
Invention Summary:
Scanning probe microscopy (SPM) offers access to material characteristics at the nanometer scale. However, integrating SPMs into research environments poses challenges: incompatibility with cryogenic temperature and high magnetic fields, noisy laboratory environment, and integration issues with...
Published: 4/21/2024
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Inventor(s): Angela Coe, Guohong Li, Eva Andrei
Keywords(s): Imaging, Machines & Instruments, Nanotechnology
Category(s): Technology Classifications > Physical Sciences & Engineering
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